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. 2016 Jul 26;6:30503. doi: 10.1038/srep30503

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Copyright © 2016, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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Cross-sectional normalized electric field distributions inside the a-Si:H TFSCs at λ = 420 nm for (a,b) and λ = 750 nm for (d,e), (c,f) are integrated electric field and calculated absorption of a cross section at the center of the sphere for TiO₂-nanosphered designs.