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. 2016 Jul 28;6:30608. doi: 10.1038/srep30608

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Copyright © 2016, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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SEM images of nanowires grown at (a) 1250 °C and (b) 1300 °C. (c–g) TEM images of a bent nanowire with lumps, and the electron diffraction patterns; (c) whole image of the nanowire, (d) an enlarged view of the tip of the nanowire, and (e) the electron diffraction pattern recorded along the [] zone axis from the tip of the nanowire. (f) The enlarged view and (g) the electron diffraction pattern of the middle section of the nanowire.

Inline graphic — SEM images of nanowires grown at (a) 1250 °C and (b) 1300 °C. (c–g) TEM images of a bent nanowire with lumps, and the electron diffraction patterns; (c) whole image of the nanowire, (d) an enlarged view of the tip of the nanowire, and (e) the electron diffraction pattern recorded along the [] zone axis from the tip of the nanowire. (f) The enlarged view and (g) the electron diffraction pattern of the middle section of the nanowire.