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. 2016 Jul 28;6:30759. doi: 10.1038/srep30759

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Copyright © 2016, The Author(s)

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Air storage stability of PV devices with different hole transport layers: (a,c,e) PEDOT:PSS, (b,d,f) NiO. (a,b) PV devices exposed to air (25 °C and 35% relative humidity) without encapsulation. (c,d) PV devices stored in N₂ box without encapsulation. (e,f) PV devices fabricated on the hole transport layers, exposed to air (25 °C and 35% relative humidity) during a certain amount of time.