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. Author manuscript; available in PMC: 2017 Aug 2.
Published in final edited form as: Lab Chip. 2016 Aug 2;16(16):3082–3096. doi: 10.1039/c6lc00451b

Table 1.

Crystallographic statistics for data obtained using on-chip micro-diffraction Laue analysis of various HEWL crystals.

Parameter Microbatch Counter-Diffusion PMMA/Graph.
PMMA/Graph. + COC Film
Data Collection

Total # Frames 55 59 30
# Frames/Spot 3 4 3
Resolution (Å) 50–1.40 50–1.41 50–1.46
Space Group P43212 P43212 P43212
Unit Cell (Å) a=b=79.1, c=37.7 a=b=79.1, c=37.3 a=b=79.1, c=37.8

Single Reflections

Total Obs. 150,678 143,638 70,996
Unique Obs. 18,294 17,608 15,629
Redundancy 8.2 8.2 4.5
Rmerge on F2 0.054 0.077 0.047
Rmerge on F 0.036 0.049 0.031
<F/σ(F)> 63.9 (28.6) 50.7 (19.9) 60.4 (33.4)

Single and Multiple Reflections Combined

Completeness (%) 77.2 (25.1) 76.6 (28.4) 74.8 (27.1)

Structure Refinement

Rwork 0.149 0.156 0.145
Rfree 0.163 0.176 0.167

Ramachandran Statistics

Favored 123 (96.9%) 122 (96.1%) 122 (96.1%)
Allowed 4 (3.1%) 5 (3.9%) 5 (3.9%)
Disallowed 0 (0.0%) 0 (0.0%) 0 (0.0%)

Values in parentheses are for the highest integrated resolution shell.