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. 2016 Jul 13;72(Pt 8):598–603. doi: 10.1107/S2053230X1601027X

Table 1. Statistics for crystallographic structural determination.

Values in parentheses are for the highest resolution shell.

Data collection
 Beamline BL-17A, Photon Factory
 Wavelength (Å) 0.9800
 Space group P21
 Unit-cell parameters (Å, °) a = 111.0, b = 98.5, c = 116.4, β = 92.0
 Resolution range (Å) 49.26–2.40 (2.55–2.40)
 Unique reflections 190708
 Multiplicity 3.5 (3.5)
 Completeness (%) 99.6 (99.0)
R merge (%) 9.5 (63.3)
R meas (%) 11.3 (74.7)
 〈I/σ(I)〉 9.2 (1.9)
 CC1/2 (%) 99.5 (74.5)
Refinement
 Resolution (Å) 49.3–2.4
R factor/free R factor 22.4/27.3
B factor (Å2) 58.6
 R.m.s. deviations
  Bond lengths (Å) 0.008
  Bond angles (°) 1.02
 Ramachandran plot (%)
  Favoured regions 97.8
  Allowed regions 2.2
  Outliers 0

R merge = Inline graphic Inline graphic, where Ii(hkl) is the ith observation of reflection hkl and 〈I(hkl)〉 is the weighted average intensity for all observations I of reflection hkl.