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. 2016 Aug 8;6:31013. doi: 10.1038/srep31013

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(a,b) The predicted short circuit current density (J_sc) and open circuit voltage (V_oc) as a function of surface recombination velocity in the top and bottom graphs respectively, and (c,d) show the predicted short circuit current density as a function of doping concentration for both bare and light trapping cells.