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. 2016 Aug 11;6:31525. doi: 10.1038/srep31525

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Copyright © 2016, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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(a) Cryo-SEM image taken after cryo-TOF-SIMS measurement and appropriate freeze-etching. Cryo-TOF-SIMS positive ion images of (b) total ion, (c) K⁺ at m/z 39, and (d) coniferin at m/z 180. (e) Schematic illustration of sample preparation and the resultant optical microscopic image of transverse surface of freeze-fixed ginkgo stem on a cryo-TOF-SIMS sample holder showing the measurement area (ca. 2.3 × 0.4 mm). Scale bars are 500 μm for (a–d) and 2 mm for (e). Arrows at both sides of images suggest the line of the cambial zone. Cryo-SEM images before and after freeze-etching are displayed in Supplementary Fig. 6. Cryo-TOF-SIMS images of mono-/di- saccharides are shown in Supplementary Fig. 7.