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. 2014 Mar 1;256:38–44. doi: 10.1016/j.ssi.2013.12.016

Table 1.

Resistive contributions of the LSC-LT thin film electrodes extracted from EIS and IEDP measurements. Models a–c correspond to the equivalent circuit models shown in Fig. 5. (C), (Q) indicate whether capacitances or constant phase elements were used. 18O 1D* and 18O var. D* correspond to the fits of tracer depth profiles using a single or variable diffusion coefficients in LSC. RLSCtotal is the sum of all resistances attributed to the LSC electrode.

LSC-LT Rif/Ωcm2 Rdiff/Ωcm2 Rs/Ωcm2 RLSCtotal/Ωcm2 Rs/(Rif + Rdiff)
Model a (C) 25.4 96.7 122 3.8
Model a (Q) 31.0 114.6 146 3.7
Model b 4.1 110.4 20.5 135 0.18
Model c 20.5 116 137 5.7
18O 1D* 27 162 189 6.0
18O var. D* 25 165 190 6.6