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. 2016 Aug 19;7:12398. doi: 10.1038/ncomms12398

Figure 4. Utilizing PEEM insights for device simulation.

Figure 4

(a) Schematic of the switching filament in the HRS and in the LRS derived from the spectromicroscopic information. Filament diameter is 500 nm. The colour scale refers to the oxygen-vacancy concentration used for the model as described in b. (b) Donor distributions as a function of depth x used for the simulation of the LRS and the HRS. (c) Experimental read-out sweeps (green and blue data points for the LRS and HRS, respectively) of the device in Fig. 3 with simulated I–V characteristics based on the model in a,b (green and blue lines). (d) Profiles of the energy of the conduction-band edge WC(x) as a function of depth at zero bias for the LRS and the HRS.