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. 2016 Aug 30;6:32171. doi: 10.1038/srep32171

Figure 5.

Figure 5

XPS Analysis of Ag-3d core level spectra of the 0.28 Ag-TiO2 films (a) As-deposited, and (b,c) Annealed at 300 °C and 400 °C respectively for 1 hour. The annealed samples have been analysed after 60 min etching.