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. 2016 Aug 9;72(Pt 9):667–671. doi: 10.1107/S2053230X16011419

Figure 2.

Figure 2

(a) Example of a multiple crystal of the SIP similar to that used for data collection on beamline I04 at DLS. (b) Detailed view of a SIP diffraction image obtained using a Pilatus 6M-F detector on beamline I04 at DLS. The numbers at the edge indicate the corresponding resolution limits. In the faintly visible diffuse scattering ring at ∼3.8 Å resolution, the maximum number of counts per pixel away from Bragg reflections is 3.