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. 2016 Sep 9;6:33098. doi: 10.1038/srep33098

Figure 7.

Figure 7

(a) Intensity profile in MEM (SV = 1.15 V) and LEEM (SV = 1.90 V). (b) Surface potential profile across a domain wall determined from the MEM-LEEM curves for over- and under-focus values.