| ADT | Accelerated degradation testing |
| SLD | Super luminescent diode |
| MOSFET | Metal oxide semiconductor field effect transistor |
| IG | Inverse Gaussian |
| Probability density function | |
| CSADT | Constant-stress accelerated degradation testing |
| SSADT | Step-stress accelerated degradation testing |
| FPT | First passage time |
| CDF | Cumulative distribution function |
| MLE | Maximum likelihood estimation |
| AIC | Akaike Information Criterion |
| IFM | Inference functions for margins |
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