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. 2016 Sep 1;138(10):1010061–10100611. doi: 10.1115/1.4034490

Table 3.

Fit parameters for critical thickness, hcrit, and saturation maximum surface displacement, uinf, for each model

Model uinf (μm) hcrit (μm)
Continuum 2.27 1.66
Delaunay network 2.85 2.45
Growth network 4.82 5.39