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. 2016 Aug 15;113(35):E5108–E5116. doi: 10.1073/pnas.1609709113

Table S1.

Summary of X-ray diffraction data and structure refinement statistics

Crystal Hg derivate MORC3+AMPPNP+H3(1–15)K4me3 MORC3+AMPPNP+H3(1–32)
Summary of diffraction data
 Beamline SSRF-BL17U1 SSRF-BL17U1 SSRF-BL19U
 PDB ID code 5IX1 5IX2
 Wavelength, Å 0.9928 0.9792 0.9792
 Space group I222 I222 I222
 Cell parameters, Å
  a 110.9 111.4 112.2
  b 151.6 149.1 147.5
  c 174.1 173.5 173.6
 Resolution, Å 50.0–2.9 (3.00–2.90)* 20.0–2.6 (2.74–2.60) 20.0–2.9 (3.06–2.90)
Rmerge, % 13.4 (70.1) 8.5 (86.6) 9.1 (70.1)
 Observed reflections 479,105 205,990 206,638
 Unique reflections 33,002 44,534 32,131
 Average I/σ(I) 34.6 (4.2) 11.8 (2.0) 12.5 (2.6)
 Completeness, % 99.9 (100.0) 99.7 (99.9) 99.6 (99.8)
 Redundancy 14.5 (14.9) 6.4 (5.9) 6.3 (6.9)
Refinement and structure model
R/Free R factor, % 21.8/23.0 22.0/23.6
 Non-H atoms 7,042 7,049
 Protein/peptide 6,751/158 6,825/158
 AMPPNP/water 62/67 62/-
 Zn2+/Mg2+ 2/2 2/2
 B factor, Å2 75.7 80.2
 Protein/peptide 75.4/93.0 79.9/101.0
 AMPPNP/water 65.5/72.7 62.9/-
 Zn2+/Mg2+ 87.9/59.1 88.5/58.9
 Rmsd
  Bond lengths, Å 0.020 0.022
  Bond angles, ° 1.790 1.871

SSRF, Shanghai Synchrotron Radiation Facility.

*

Values in parentheses are for the highest shell.