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. Author manuscript; available in PMC: 2016 Sep 15.
Published in final edited form as: J Electrochem Soc. 2016;163(4):H3032–H3037. doi: 10.1149/2.0071604jes

Figure 3.

Figure 3

SEM images of (A) unmilled and (B) FIB-milled carbon nanotips and the corresponding FIB images in parts C and D, respectively. Scale bars: 200 nm in parts A and B, and 500 nm in parts C and D.