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. Author manuscript; available in PMC: 2016 Sep 15.
Published in final edited form as: J Electrochem Soc. 2016;163(4):H3032–H3037. doi: 10.1149/2.0071604jes

Figure 5.

Figure 5

Figure 5

Approach curves of SiO2-coated silicon wafers as obtained by using FIB-milled carbon nanotips with a = (A) 119, (B) 44, and 27 nm in PBS of 1 mM Ru(NH3)6Cl3. Solid and dashed lines represent simulated curves.