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. Author manuscript; available in PMC: 2016 Sep 15.
Published in final edited form as: J Electrochem Soc. 2016;163(4):H3032–H3037. doi: 10.1149/2.0071604jes

Figure 7.

Figure 7

SEM images of (A) unmilled and (B) FIB-milled carbon nanotips with ESD damage. The latter tip was used for CV measurements in the bulk solution before SEM imaging. Scale bars: (A) 500 nm and (B) 200 nm.