Figure 1. Properties of Pt/BaM films and Hall bar samples.

(a) AFM surface image of the BaM film. The r.m.s. roughness is 0.17±0.02 nm. The roughness value is an average over the measurements on nine different 1 × 1 μm areas, and the uncertainty is the corresponding standard deviation. (b) XRD spectrum of the BaM film. (c) Magnetic hysteresis loops of the BaM film. (d) Optical image of the Pt(5 nm)/BaM(3 nm) Hall bar structure. Scale bar, 20 μm. (e) Anomalous Hall resistance R_AHE of the Hall bar measured as a function of a magnetic field. The inset is a schematic showing the magnetic field (H) direction which is in the yz plane and 20° away from the +z axis. (f) Angle-dependent longitudinal resistance R_yy of the Hall bar. The insets show the H directions for the α, β and γ scans. α is the angle of the field relative to +z in the yz plane, β is the angle of the field relative to the +z in the xz plane and γ is the angle of the field relative to +x in the xy plane. All the measurements were done at room temperature.