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. 2016 Sep 26;6:34003. doi: 10.1038/srep34003

Figure 4. Electrical resistivity measurements.

Figure 4

(a) I-V characteristics of the “in-situ” purified FEBID Au nanowire. The inset in (a) shows an SEM image of the used four-point contacts. (b) A measurement series with increasing maximum current from 1.5 mA to 10 mA is shown. The insets in (b) show an AFM image and height profile of the deposited structure.