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. 2016 Sep 29;6:34474. doi: 10.1038/srep34474

Figure 3.

Figure 3

Surface topographic (a) and the corresponding conducting AFM (b) images of an hBN monolayer and a bilayer grown on HOPG. (c) Vertical resistance as a function of the hBN layer thickness determined by performing current-voltage measurements on the hBN surface at different positions on the substrate surface. Note the exponential dependence of the electrical resistance on the number of the hBN layers.