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. 2016 Sep 29;6:34294. doi: 10.1038/srep34294

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Copyright © 2016, The Author(s)

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(a) Compositional profiles across NbO₂ and Nb₂O₅ film (180 nm thick) from quantitative EELS analysis with cross-sectional STEM DF image in the inset. The STEM EELS spectrum image were collected with pixel size of 1 nm across the thin film (as shown in the rectangular area). The quantification were done by subtraction of pre-edge power law background and integrate Nb-M_4,5 edge and O-K edge window. (b) HRTEM image of the as-prepared NbO₂ film shows the amorphous microstructure and was confirmed by the diffuse ring in the fast Fourier transform in the inset.