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. 2016 Sep 29;6:34294. doi: 10.1038/srep34294

Figure 2. Microstructural evolution in NbO2 thick film as the function of annealing temperature.

Figure 2

(a) BF cross-sectional TEM image and (b) SAED pattern at 700 °C; (c) BF image and (d) SAED pattern from NbO2 with distorted rutile phase along [103] at 750 °C; (e) BF image and (f) SAED pattern from NbO2 with distorted rutile phase along [001] at 800 °C.