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. 2016 Oct 7;6:33050. doi: 10.1038/srep33050

Figure 3.

Figure 3

HRTEM analysis of bare DE-derived nanoSi, including Si crystals of various orientations and the indexed selected area electron diffraction pattern as an inset (a), select nanoSi particles showing the d-spacing of crystalline Si (b), a select larger Si particle with well-distinguished Si core and amorphous surface layer with FFT inset (c) and a similar larger particle analyzed by dark-field EDX mapping showing the Si core and oxide surface layer (d).