Figure 1.

(a) Cross-sectional bright field TEM micrographs of Ni–carbon nanocomposites in as-deposited state (bottom) and after anneals at 300 (middle) and 800 °C (top). (b) SAED patterns corresponding to (a). The overlays show extracted radially integrated SAED profiles⁶³ with the identified phases indexed. Note that in the SAED pattern of the as-deposited film additional possible Ni₃C(104) reflections^24,64,65 are indicated (see Supporting Information for a comment on Ni₃C phase assignment). Estimated uncertainty in temperature for the ex situ anneals is ±10 °C.