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. 2016 Oct 12;6:35087. doi: 10.1038/srep35087

Figure 1. XFEL-induced sample ablation and experimental geometry.

Figure 1

Radiation damages on the surfaces of Si (a) and La-doped SrTiO3 (b) when operating with a microfocused XFEL beam at a fluence, i.e., pulse energy per area, of 175 Jcm−2. The direction of photon incidence is indicated by arrows. (c) The angle of photon incidence ϑ (relative to the sample surface) can be varied by sample rotation, resulting in a changed spot diameter dx on the sample surface at a constant spot diameter dy. The axis of the entrance lens of the photoelectron spectrometer (z direction) was perpendicular to the direction of the photon beam (x direction) in all cases.