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. 2015 Dec 9;16(6):065006. doi: 10.1088/1468-6996/16/6/065006

Table 3. Characteristics of nanoscaled CuO in the ADaM test media under realistic and worst-case conditions.

Properties/characteristics CuO NNV-011 CuO NNV-011 + 0.1% TSPP
Particle size in ADaM after dispersion (at t = 0; smallest dispersable unit) xDLS Not measurable 132 ± 5 nm
Zeta potential in ADaM Not measurable −64 mV