Figure 5. X-ray diffraction characterization of Li_xMoS₂ samples.

(a) X-ray diffraction spectra for MoS₂ thin-film samples on sapphire substrate. The two diffraction peaks coincide with the standard X-ray diffraction powder patterns of MoS₂ (100) and (110). Therefore, the dominant lattice orientation in the MoS₂ thin-film samples are (100) and (110). The diffraction peak at 32.8° and 58.5° corresponds to a lattice constant of 2.73 and 1.58 Å, respectively. (b) Lattice spacing d between MoS₂ layers in bulk MoS₂ samples. The error bars are calculated by taking into account the experimental errors and the systematic errors that propagate from uncertainties in the fitting of X-ray diffraction spectra. The inset plot is the change of MoS₂ (002) peak position with x in Li_xMoS₂.