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. 2016 Oct 20;7:13065. doi: 10.1038/ncomms13065

Figure 3. Characterization of TiO@C-HS and other control host materials.

Figure 3

(ac) SEM images, (e,i,m,q) X-ray diffraction patterns, (d,fh,jl,np,rt) TEM images of (ah) TiO@C-HS, (il) TiO2@C-HS, (mp) TiO2−x@C-NP, (q,r) TiO2-NP and (s,t) C-HS. Scale bars, 1 μm (a), scale bars, 200 nm (b), scale bars, 100 nm (c,g,k,n,s), scale bars, 500 nm (f,j,t), scale bars, 10 nm (d), scale bars, 5 nm (l), scale bars, 2 nm (h,o,p), scale bars, 50 nm (r). a.u., arbitrary unit.