Table 1.

Surface properties of the samples.

sample	θS water	θA/θR water	θS n-hexadecane	θA/θR n-hexadecane	thickness	Rrmsa
Si	—	—	—	—	—	0.16 nm
ODS	103°	106°/96°	10°	12°/5°	1.9 nm	0.23 nm
FAS17	113°	121°/108°	70°	73°/60°	1.1 nm	0.27 nm
C10-hybrid	111°	114°/106°	35°	36°/35°	700 nm	1.24 nm
Never Wet	155°	160°/158°	dissolved	—	≈35 μm	5.2 μm
VUV-Never Wet	—	—	dissolved	—	≈35 μm	6.3 μm
Soot-TMOS-FAS17Cl	163°	165°/160°	155°	161°/153°	<1.6 μm	0.2 μm

^aR_rms values of Si with and without an ODS-monolayer, FAS17-monolayer, and C₁₀-hybrid film were estimated using AFM images (3 × 3 μm²) shown in Figure 2; those of Never Wet, VUV-Never Wet and Soot-TMOS-FAS17Cl were estimated by a stylus profilometer.