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. 2016 Oct 19;16(10):1742. doi: 10.3390/s16101742

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© 2016 by the authors; licensee MDPI, Basel, Switzerland.

This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).

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Effect of chemical etching treatments on surface topography (as mapped by Zygo interferometer): (a) native flattened Ag wire; (b) 30 s NH₄OH; (c) 10 s HNO₃; (d) 2 m HNO₃; (e) 30 s NH₄OH followed by 10 s HNO₃; and (f) 30 s NH₄OH followed by 2 m HNO₃ etching treatments.

Effect of chemical etching treatments on surface topography (as mapped by Zygo interferometer): (a) native flattened Ag wire; (b) 30 s NH₄OH; (c) 10 s HNO₃; (d) 2 m HNO₃; (e) 30 s NH₄OH followed by 10 s HNO₃; and (f) 30 s NH₄OH followed by 2 m HNO₃ etching treatments.