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. 2016 Oct 26;7:13232. doi: 10.1038/ncomms13232

Figure 9. High-resolution transmission electron microscopy images of samples A and B.

Figure 9

Top row: high-angle annular dark-field/scanning transmission electron microscopy (HAADF/STEM), a contrast between GaN and 32-nm thick (Ga,Mn)N films on the top of the structures is detected with no indications of Mn aggregation. Bottom row: high-resolution transmission electron microscopy (HRTEM) images for both layers reveal their single phase nature.