RIGAKU R-AXIS RAPID II diffractometer	2087 independent reflections
Radiation source: rotating anode X-ray	1762 reflections with I > 2σ(I)
Detector resolution: 10.0 pixels mm-1	Rint = 0.036
ω–scan	θmax = 68.2°, θmin = 3.6°
Absorption correction: multi-scan (ABSCOR; Higashi, 1995)	h = −17→17
Tmin = 0.789, Tmax = 0.924	k = −5→5
12627 measured reflections	l = −20→21