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. 2008 Sep 1;9(3):035007. doi: 10.1088/1468-6996/9/3/035007

Figure 1.

Figure 1

(a) XRD patterns of zinc oxide thin films grown at a pH of (A) 8, (B) 9 and (C) 10 by the chemical double-dip method. (b) Enlarged region of the (002) plane showing the shift in the XRD peak due to effect of the pH, and (c) Variation of crystallite size and RMS microstrain for ZnO thinfilms under the effect of pH at (A) 8, (B) 9 and (C) 10.