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. 2014 Sep 23;15(5):055006. doi: 10.1088/1468-6996/15/5/055006

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© 2014 National Institute for Materials Science

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Figure 2. — (a) X-ray diffraction (XRD) patterns of the TiO₂ NRAs/CdS NPs. Inset is the XRD pattern of TiO₂ NRAs by step scanning method in the scanning range of 23.5°–28.5°; (b) Raman spectrum of TiO₂ NRAs. A: anatase, R: rutile, Si: Si substrate.