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. 2016 Feb 23;17(1):20–28. doi: 10.1080/14686996.2016.1140308

Figure 8.

Figure 8.

XPS measurements on the F-MIE samples. From panel (a) to (d): 400, 600, 800, and 1000 V bias. The depth is not calibrated. The amount of oxygen in the outliers 600 and 800 V is considerably higher than the other two: this supports the idea of formation of oxides against the one on silicides. See text for discussion.