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. Author manuscript; available in PMC: 2017 Aug 3.
Published in final edited form as: J Phys D Appl Phys. 2016 Jul 11;49(30):305002. doi: 10.1088/0022-3727/49/30/305002

Figure 1.

Figure 1

Profile for the applied field, obtained by the summation of the ramping bias field and an oscillating drive field. [left] The applied offset field, corresponding to a slowly moving field free point in a MPI imager, [middle] the drive field and [right] the field experienced by a nanoparticle is the summation of the bias field and the drive field.