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. 2016 Nov 22;5:37440. doi: 10.1038/srep37440

Figure 2. Specular X-ray reflectivity (black squares) from the Pt/Cr bilayer deposited on the Si substrate, together with the fitting curves (solid red lines).

Figure 2

The error bars indicate ±1 standard deviation. The X-ray energy at which the corresponding data were taken is indicated to the right. The curves are offset by one order of magnitude for clarity.