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. 2016 Oct 5;7(11):4400–4414. doi: 10.1364/BOE.7.004400

Fig. 2.

Fig. 2

(a) The phantom used for the PSF measurement; (b) schematic of the Bessel beam geometry and photograph of the Bessel beam scattered in the phantom used for the measurement of PSF; (c) structural B-scan (logarithmic scale) of the phantom with color-coded depth; (d) en face image of the artifact, depth coded as in (c) Scale bar: 20 μm.