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. 2016 Nov 4;17(1):698–714. doi: 10.1080/14686996.2016.1242999

Figure 2.

Figure 2.

Atomic force microscopy (AFM) images of poly-lactic acid (PLLA)/PS demixed nanopit-textured films spin-cast at 0.5% solution concentration (forming 14 nm deep pits),1% solution concentration (forming 29 nm deep pits), and 1.5% solution concentration (forming 45 nm deep pits) and flat PLLA films. Images reproduced with permission from [46].