Figure 2.
Atomic force microscopy (AFM) images of poly-lactic acid (PLLA)/PS demixed nanopit-textured films spin-cast at 0.5% solution concentration (forming 14 nm deep pits),1% solution concentration (forming 29 nm deep pits), and 1.5% solution concentration (forming 45 nm deep pits) and flat PLLA films. Images reproduced with permission from [46].