Table 2.
The descriptive statistics of three workplace types and total measured by P-SMPS, CPC, and SAM
| Workplace | Geometric mean (geometric standard deviation) (5th–95th percentile) |
||||
|---|---|---|---|---|---|
| Portable-SMPS (particles/cm3) |
CPC (particles/cm3) | SAM (μm2/cm3) | |||
| Total number concentration | ≤ 100 nm | > 100 nm | |||
| LAB (A, B, C) | 8,458 (1.41) (3,695–16,668) |
5,879 (1.49) (2,600–13,328) |
2,521 (1.30) (665–4,196) |
6,143 (1.45) (3,613–16,209) |
32.79 (1.46) (7.94–98.51) |
| ENP (D, E, F) | 19,612 (2.18) (5,152–54,428) |
14,969 (2.18) (3,047–43,294) |
4,643 (2.00) (1,421–12,089) |
11,955 (2.42) (3,575–58,153) |
93.68 (2.60) (24.57–549.09) |
| UNP (G, H, I) | 84,172 (2.80) (14,249–369,765) |
61,167 (2.94) (10,667–315,822) |
16,539 (3.23) (2,059–91,790) |
38,886 (2.61) (6,039–134,751) |
358.41 (2.74) (61.37–1,514.03) |
CPC, condensation particle counter; ENP, engineered nanoparticle manufacturing workplace; LAB, laboratory; LEV, local exhaust ventilation; SAM, surface area monitor; SMPS, scanning mobility particle sizer; UNP, unintended nanoparticle emitted workplace.