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. 2016 Nov 30;6:38255. doi: 10.1038/srep38255

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Copyright © 2016, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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(a) Photograph of the fabricated tunable metasurface, with inset depicting a supercell of the sample. Measured (symbols) and FDTD-simulated (line) scattering patterns of the tunable metasurface at 5 frequencies, when the sample is biased (b) at the required voltage combination corresponding to each frequency, (c) at 0 V voltage, and (d) at the fixed voltage combination (denoted by ) corresponding to the frequency 5.5 GHz. (e) Frequency-dependent anomalous-reflection efficiency of our device for the cases studied in (b) (red), (c) (blue), and (d) (black), obtained by analyzing the measured (symbols) and FDTD simulated (lines) scattering patterns.

Inline graphic — (a) Photograph of the fabricated tunable metasurface, with inset depicting a supercell of the sample. Measured (symbols) and FDTD-simulated (line) scattering patterns of the tunable metasurface at 5 frequencies, when the sample is biased (b) at the required voltage combination corresponding to each frequency, (c) at 0 V voltage, and (d) at the fixed voltage combination (denoted by ) corresponding to the frequency 5.5 GHz. (e) Frequency-dependent anomalous-reflection efficiency of our device for the cases studied in (b) (red), (c) (blue), and (d) (black), obtained by analyzing the measured (symbols) and FDTD simulated (lines) scattering patterns.