Skip to main content
. Author manuscript; available in PMC: 2017 Aug 31.
Published in final edited form as: ACS Appl Mater Interfaces. 2016 Aug 22;8(34):22629–22636. doi: 10.1021/acsami.6b05754

Figure 2. Process characterization.

Figure 2

a) SEM image of a femtosecond laser machined pore on the surface of a fused silica wafer. The pore was opened using a single 3.2 μJ, 790 ηm, 160 femtosecond laser pulse; b) SEM image of a PVA replica (Pt coated, 45° stage tilt). c) A single PVA nanoneedle with a final length of 10 μm. d) same PVA nanoneedle at 30° stage tilt.