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. 2016 Dec 2;6:38203. doi: 10.1038/srep38203

Figure 1. OTFT structure and setup for force microscopy on bent substrates.

Figure 1

(a) scheme showing the transistor structure, applied voltages in SKPM mode and a 3D rendered AFM topography of two semiconducting crystals bridging the transistor channel; (b) optical micrograph of micro-crystalline TIPS-pentacene thin film deposited on transistor channel and inspected by force microscopy. The AFM cantilever is visible in the image; (c) photography of sample holder with bent transistor (rc = 5.6 mm) below the force microscope’s probe hand.