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. 2016 Nov 28;7:13682. doi: 10.1038/ncomms13682

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Copyright © 2016, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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(a) Schematic drawing of the measurement setup. (b) Simulated and measured focal plane intensity profiles of the metasurface doublet lens for different incident angles (θ). Simulation results are shown in the top row, and the measurement results for the transverse electric (TE) and the transverse magnetic (TM) polarizations are shown in the second and third rows, respectively. Simulation results are obtained using scalar approximation (that is, ignoring polarization dependence). Scale bar, 2 μm. (c) Simulated and measured focal plane intensity profiles for a metasurface singlet with the same aperture diameter and focal length as the metasurface doublet. For the range of angles shown, the measured intensity distributions are polarization insensitive. Scale bar, 2 μm. (d) Measured focusing efficiency of the metasurface doublet for TE- and TM-polarized incident light as a function of incident angle. The measured data points are shown by the symbols and the solid lines are eye guides. (e) Transverse location of the focal spot for the doublet lens as a function of incident angle. The measured data points are shown by the symbols, and the solid line shows the f sin(θ) curve, where f=717 μm is the focal length of the metasurface doublet lens.