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. 2016 Nov 11;49(Pt 6):2082–2090. doi: 10.1107/S160057671601431X

Table 2. Diffraction statistics for ten X-ray data sets collected from the crystallization screening plate.

R sym is defined as ∑(I − 〈I〉)2/∑I 2.

Crystal 1 2 3 4 5 6 7 8 9 10
Unit cell a = b, c (Å) 79.27, 37.63 79.44, 37.78 79.43, 37.69 79.29, 37.70 79.26, 37.71 79.25, 37.83 79.26, 37.74 79.46, 37.82 79.26, 37.72 79.27, 37.72
Resolution (Å) 50–1.26 (1.28–1.26) 50–1.31 (1.33–1.31) 50–1.31 (1.33–1.31) 50–1.31 (1.33–1.31) 50–1.50 (1.52–1.50) 50–1.21 (1.23–1.21) 50–1.37 (1.39–1.37) 50–1.34 (1.36–1.34) 50–1.25 (1.27–1.25) 50–1.23 (1.25–1.23)
Unique reflections 29163 25138 25055 23524 15096 32640 20285 21719 28058 29547
Completeness (%) 91 88 87 82 78 90 81 81 85 85
Redundancy 1.1 1.2 1.2 1.2 1.3 1.1 1.2 1.2 1.2 1.2
I/σ(I)〉 29 (2) 34 (3) 28 (2) 26 (2) 20 (2) 34 (3) 32 (2) 30 (2) 37 (3) 34 (3)
R sym 0.105 (0.99) 0.091 (0.95) 0.065 (0.69) 0.081 (0.84) 0.100 (0.95) 0.063 (0.66) 0.073 (0.72) 0.076 (0.68) 0.086 (0.83) 0.064 (0.64)