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. 2016 Dec 7;6:38682. doi: 10.1038/srep38682

Figure 2.

Figure 2

(a) SEM image of the nanostructure, inset fast Fourier transform (FFT) of the structure where 1 and 2 (white-lines) are the (2, 0) and (0, 2) lattice vectors, whose moduli correspond to a periodicity of 339 ± 3 nm. (b) Cross sectional SEM image used to estimate the mean profile. (c) Mean profile of the cones, scaled to the experimental data (red line), and optimal profile extracted from the reflectance fitting (blue dash-dotted line). The optimal lattice parameter is a = 340 nm (vertical dashed black).