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. 2016 Dec 12;7:13713. doi: 10.1038/ncomms13713

Figure 1. Sample photos and structural characterization.

Figure 1

(a) The photos of SnSe single crystal, (b) cleaved sample, (c) XRD pattern of SnSe single crystals. (h00) diffraction peaks indicate that the crystallographic a axis is perpendicular to the cleaved plane of the single crystal. The inset is FE-SEM image. Note that all samples, including undoped and Bi-doped samples, show identical XRD pattern.