Figure 1. Sample photos and structural characterization.
(a) The photos of SnSe single crystal, (b) cleaved sample, (c) XRD pattern of SnSe single crystals. (h00) diffraction peaks indicate that the crystallographic a axis is perpendicular to the cleaved plane of the single crystal. The inset is FE-SEM image. Note that all samples, including undoped and Bi-doped samples, show identical XRD pattern.