Table 2.

Absolute CSs for the loss of the supercoiled configuration and the formation of SSB, DSB and CL by 4.6, 5.6, 9.6, 14.6 eV electrons. SD denotes the standard deviation of the CS at each thickness

Electron energy (eV)	Film thickness (nm)	σLS (×10−14 cm2)	σSSB (×10−14 cm2)	σDSB (×10−15 cm2)	σCL (×10−15 cm2)
4.6	10	4.31	3.84	n.d.	4.6
	15	4.46	3.62	n.d.	4.8
	20	4.27	3.73	n.d.	4.7
	Average + SD	4.34 ± 0.10	3.73 ± 0.11	—	4.7 ± 0.1
5.6	10	2.98	2.36	4.1	5.6
	15	2.65	1.92	3.4	6.0
	20	2.51	1.88	3.1	5.5
	Average + SD	2.71 ± 0.24	2.05 ± 0.27	3.5 ± 0.5	5.7 ± 0.3
9.6	10	5.06	4.76	4.5	8.0
	15	5.14	4.57	4.1	7.4
	20	5.04	4.39	4.4	7.2
	Average + SD	5.08 ± 0.05	4.57 ± 0.18	4.3 ± 0.2	7.5 ± 0.4
14.6	10	2.39	1.96	n.d.	5.7
	15	2.43	1.78	n.d.	5.4
	20	2.38	1.77	n.d.	4.9
	Average + SD	2.4 ± 0.03	1.84 ± 0.10	—	5.3 ± 0.4

n.d.: not detected.