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. Author manuscript; available in PMC: 2017 Sep 1.
Published in final edited form as: J Am Soc Mass Spectrom. 2016 Jun 20;27(9):1476–1482. doi: 10.1007/s13361-016-1423-z

Figure 3.

Figure 3

Sputter depth profiles of a trehalose film using Ar2000 + and (CO2)1831 +, respectively. Arrows indicate the interface between trehalose and the silicon substrate. The AFM images of the crater produced by each projectile are also shown. Note that the film thickness is slightly different for each case.